• DocumentCode
    870897
  • Title

    Band Effects on the Transport Characteristics of Ultrascaled SNW-FETs

  • Author

    Gnani, Elena ; Gnudi, Antonio ; Reggiani, Susanna ; Luisier, Mathieu ; Baccarani, Giorgio

  • Author_Institution
    Adv. Res. Center on Electron. Syst. (ARCES), Univ. of Bologna, Bologna
  • Volume
    7
  • Issue
    6
  • fYear
    2008
  • Firstpage
    700
  • Lastpage
    709
  • Abstract
    In this paper, we investigate band-structure effects on the transport characteristics of ultrascaled silicon nanowire (SNW) FETs by means of quantum transport simulations. To this purpose, a new approach is used for the solution of the open-boundary Schrodinger equation in the SNW, accounting for the appropriate dispersion relationships of the subbands induced by the confinement of the 1-D electron gas. The model is validated by comparison with 3-D atomistic simulations based on the tight-binding approach, and simulation results are compared with a simpler effective-mass model with either constant and fitted (not bulk-like) transport effective masses. The proposed model predicts: (1) the possibility of negative differential output conductance in thin SNW-FETs related with the finite energy extension of the subbands; (2) an increase of the intrinsic transit time, corresponding to a reduced electron average velocity; and (3) a degradation of the subthreshold slope at short channel lengths, due to enhanced tunneling currents.
  • Keywords
    Schrodinger equation; band structure; effective mass; elemental semiconductors; field effect transistors; nanowires; semiconductor quantum wires; silicon; 1-D electron gas; Si; band effects; band-structure effects; enhanced tunneling currents; finite energy extension; negative differential output conductance; open-boundary Schrodinger equation; quantum transport simulations; reduced electron average velocity; subthreshold slope degradation; transport characteristics; ultrascaled silicon nanowire FET; 1-D electron gas (1DEG); nonparabolicity effects; quantum transport; silicon nanowire (SNW)-FET; tight binding (TB);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2005777
  • Filename
    4630754