DocumentCode
871028
Title
Cosmic Ray Interactions with Boron: A Possible Source of Soft Errors
Author
Fleischer, Robert L.
Author_Institution
General Electric Research & Development Center Schenectady, NY 12301, USA
Volume
30
Issue
5
fYear
1983
Firstpage
4013
Lastpage
4015
Abstract
Neutron interactions with 10B produce pairs of heavily ionizing particles (4He and 7Li) that can contribute to soft errors in integrated circuits. The effect from boron exceeds that from cosmic rays incident on silicon nuclei if the boron concentration exceeds 1020/cc, which is often present in p-type Si and which is exceeded in common packaging sealing glasses. Intercomparison of cosmic ray-induced and spontaneous sources is provided.
Keywords
Alpha particles; Atmosphere; Boron; Cosmic rays; Glass; Integrated circuit packaging; Ionization; Neutrons; Semiconductor device packaging; Silicon;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4333061
Filename
4333061
Link To Document