Title :
Enhanced field emission investigation of aluminum
Author :
Renner, Ch ; Niedermann, Ph. ; Fischer, O.
Author_Institution :
Dept. de Phys. de la Matiere Condensee, Geneve Univ., Switzerland
fDate :
12/1/1989 12:00:00 AM
Abstract :
Enhanced field emission on high-purity aluminum has been investigated. The current/voltage characteristic (Fowler-Nordheim plot), the chemical composition as determined by Auger electron spectroscopy and X-ray microprobe analysis, and the topography of field-emitting sites were studied locally. In addition, results on the evolution of these sites under heat treatment, Ar+ sputtering, and exposure to atmosphere are presented. The field-emitting sites on aluminum are all related to particles ~30 μm in size standing on the surface. The average emission over 1-cm2 areas is little affected by the abovementioned surface treatments
Keywords :
Auger effect; aluminium; electron field emission; surface treatment; Al; Auger electron spectroscopy; Fowler-Nordheim plot; X-ray microprobe analysis; chemical composition; current/voltage characteristic; enhanced electron field emission; field-emitting sites; heat treatment; sputtering; surface treatments; Aluminum; Argon; Chemical analysis; Electrons; Heat treatment; Spectroscopy; Sputtering; Surface topography; Surface treatment; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
