Title :
SAND83-1541C Seeing through the Latch-Up Window
Author :
Coppage, F.N. ; Allen, D.J. ; Dressendorfer, P.V. ; Ochoa, A. ; Rauchfuss, J. ; Wrobel, T.F.
Author_Institution :
Sandia National Laboratories Albuquerque, New Mexico 87185
Abstract :
The observation of radiation-induced latch-up windows has caused doubt in the validity of accepted latch-up screens. Models giving a plausible explanation of latch-up windows are presented which show that they are only a special case of latch-up as explained by many investigators and can be treated accordingly. Furthermore, they are eliminated when latch-up is prevented by either neutron irradiation of the devices or utilization of epitaxial substrates.
Keywords :
Integrated circuit measurements; Inverters; Laboratories; Neutrons; Photoconductivity; Pulse measurements; Semiconductor device modeling; Semiconductor process modeling; Substrates; Thyristors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333093