مرکز منطقه ای اطلاع رساني علوم و فناوري - 22nd IEEE International Conference on Microelectronic Test Structures

DocumentCode :

871426

Title :

22nd IEEE International Conference on Microelectronic Test Structures

Volume :

Issue :

fYear :

2008

Firstpage :

2806

Lastpage :

2806

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Devices, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9383

Type :

jour

DOI :

10.1109/TED.2008.2006522

Filename :

4631406

Link To Document :