Title :
A Radiation Hardened Gate Array Family Using an Advanced Di Bipolar Technology
Author :
Wood, G.M. ; Sanders, T.J. ; Casey, R.H.
Author_Institution :
Harris Semiconductor Melbourne, Florida 32901
Abstract :
Gate arrays have been used for several years to provide a systems designer with a low cost fast turn option in obtaining custom LSI logic circuits. This paper describes a new family of TTL compatible bipolar arrays which have been optimized for radiation hardness.
Keywords :
Circuits; Conductivity; Dielectric thin films; Geometry; Large scale integration; Logic arrays; Neutrons; Photoconductivity; Radiation hardening; Resistors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333106
