DocumentCode
871428
Title
A Radiation Hardened Gate Array Family Using an Advanced Di Bipolar Technology
Author
Wood, G.M. ; Sanders, T.J. ; Casey, R.H.
Author_Institution
Harris Semiconductor Melbourne, Florida 32901
Volume
30
Issue
6
fYear
1983
Firstpage
4187
Lastpage
4191
Abstract
Gate arrays have been used for several years to provide a systems designer with a low cost fast turn option in obtaining custom LSI logic circuits. This paper describes a new family of TTL compatible bipolar arrays which have been optimized for radiation hardness.
Keywords
Circuits; Conductivity; Dielectric thin films; Geometry; Large scale integration; Logic arrays; Neutrons; Photoconductivity; Radiation hardening; Resistors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4333106
Filename
4333106
Link To Document