DocumentCode
871528
Title
An explanation of the "Energy" dependence of secondary breakdown in transistors
Author
Reich, B. ; Hakim, E.B.
Volume
53
Issue
6
fYear
1965
fDate
6/1/1965 12:00:00 AM
Firstpage
624
Lastpage
625
Keywords
Electric breakdown; Electrical resistance measurement; Equations; Error correction; Maximum likelihood detection; Sampling methods; Silicon; Thermal resistance; Voltage; Wiener filter;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1965.3938
Filename
1445868
Link To Document