DocumentCode :
871558
Title :
Effects of electron irradiation on metal-oxide semiconductor transistors
Author :
Stanley, A.G.
Volume :
53
Issue :
6
fYear :
1965
fDate :
6/1/1965 12:00:00 AM
Firstpage :
627
Lastpage :
628
Keywords :
Circuits; Conductors; Electrons; FETs; Impedance matching; Joining processes; Leakage current; MOS devices; Reflection; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3941
Filename :
1445871
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=871558
