DocumentCode
871605
Title
An ultra high speed test system
Author
Henley, Francois J.
Author_Institution
Photon Dynamics Inc., San Jose, CA, USA
Volume
6
Issue
1
fYear
1989
Firstpage
18
Lastpage
24
Abstract
The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.<>
Keywords
digital instrumentation; electro-optical devices; integrated circuit testing; 4.5 GHz; GaAs pin electronics; electrooptic measurement; emitter-coupled logic level; functional test; laser-scanned optical sensors; nonrepeating zero; test-head subsystem; ultra high speed test system; Bandwidth; Electronic equipment testing; Electrooptic devices; Gallium arsenide; Lasers and electrooptics; Logic testing; Optical receivers; Optical sensors; Performance evaluation; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.20386
Filename
20386
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