Title :
Realistic built-in self-test for static RAMs
Author :
Dekker, Rob ; Beenker, Frans ; Thijssen, Loek
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
The authors present the specification and design of a self-test mechanism for static random-access memories (RAMs). The test algorithm provides excellent fault detection, and its structure is independent of address and data scrambling. The self-test machine generates data backgrounds on chip and is therefore suitable for both bit-oriented and word-oriented SRAMs. It is also suitable for both embedded SRAMs and stand-alone SRAMs, and adapts to boundary-scan environment. Because of the regular and symmetric structure of the test algorithm, the silicon overhead is only 3% for a 16 K synchronous SRAM.<>
Keywords :
automatic testing; integrated circuit testing; integrated memory circuits; random-access storage; boundary-scan environment; built-in self-test; fault detection; regular structure; silicon overhead; static RAMs; symmetric structure; Automatic testing; Built-in self-test; Hardware; Multiplexing; Pins; Random access memory; Read-write memory; Silicon; System testing; Test equipment;
Journal_Title :
Design & Test of Computers, IEEE
