Title :
Boundary scan with built-in self-test
Author :
Gloster, Clay S. ; Brglez, Franc
Author_Institution :
Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
Abstract :
The authors propose a way to merge boundary scan with the built-in self-test (BIST) of printed circuit boards. Their boundary-scan structure is based on Version 2.0 of the Joint Task Action Group´s recommendations for boundary scan and incorporates BIST using a register based on cellular automata (CA) techniques. They examine test patterns generated from this register and the more conventional linear-feedback shift register. The advantages of the CA register, or CAR, are its modularity, which allows modification without major redesign, its higher stuck-at fault coverage, and its higher transition fault coverage.<>
Keywords :
automatic testing; printed circuit testing; Joint Task Action Group´s; Version 2.0; boundary scan; built-in self-test; cellular automata; linear-feedback shift register; modularity; printed circuit boards; stuck-at fault coverage; Automatic testing; Built-in self-test; Circuit testing; Hardware; Integrated circuit interconnections; Latches; Logic testing; Pattern analysis; Pins; Shift registers;
Journal_Title :
Design & Test of Computers, IEEE
