DocumentCode :
871687
Title :
A planar-doped 2D-hole gas base AlGaAs/GaAs heterojunction bipolar transistor grown by molecular beam epitaxy
Author :
Malik, Roger J. ; Lunardi, Leda M. ; Walker, John F. ; Ryan, Robert W.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
9
Issue :
1
fYear :
1988
Firstpage :
7
Lastpage :
9
Abstract :
A novel type of AlGaAs/GaAs heterojunction bipolar transistor (HBT) which uses a two-dimensional (2-D) hole gas base formed by planar doping using molecular-beam epitaxy (MBE) has been demonstrated. The base consists of a submonolayer of Be atoms of sheet concentration 0.5-5*10/sup 13/ cm/sup -2/ which is deposited during growth interruption by MBE. The transistor structure exhibits DC current gains up to 700. The effective base transit time is negligible in these transistors and it is postulated that very high-speed nonequilibrium transport may occur in the collector region.<>
Keywords :
III-V semiconductors; aluminium compounds; bipolar transistors; gallium arsenide; molecular beam epitaxial growth; semiconductor growth; 2D hole gas base; AlGaAs-GaAs heterojunction bipolar transistor; Be submonolayer; DC current gains; HBT; growth interruption; molecular beam epitaxy; planar doping; very high-speed nonequilibrium transport; Atomic layer deposition; Bipolar transistors; Delay effects; Doping; Electron mobility; FETs; Frequency; Gallium arsenide; Heterojunction bipolar transistors; Molecular beam epitaxial growth;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.20396
Filename :
20396
Link To Document :
بازگشت