Title :
Automatic Test Generation Methods for Large Scale Integrated Logic
Author :
Jones, Edwin R. ; Mays, C. Hugh
fDate :
12/1/1967 12:00:00 AM
Abstract :
Methods for generating tests for combinatorial and sequential logic circuits are discussed. A survey of existing techniques is given. An integrated approach that uses many of the existing methods plus new techniques is described and illustrated.
Keywords :
Large-scale integration; Manufacturing testing; Automatic logic units; Automatic testing; Circuit faults; Circuit testing; Fault detection; Integrated circuit testing; Large scale integration; Logic testing; Sequential analysis; Sequential circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1967.1049822
