CXR Testing of Box IEMP Effects Due to Charge Transfer

In summary, the CXR test and analysis technique has been shown to be applicable to the characterization of direct drive SGEMP effects within a PWM. The high signal to noise ratio associated with the continuous mode exposure and the well-characterized X-ray source allow an accurate calibration of SGEMP response models over a wide range of parameters. SGEMP response models for a PWM were calibrated using the CXR test and analysis method resulting in the ability to make high confidence predictions of the response to arbitrary environments. The results of this test have established the fact that a CXR test of an object as complex as a PWM is feasible. A PWM is significantly more complicated than a typical cable, it is composed of more than 600 separate conductors as compared to two conductors in a typical coaxial cable. In addition, the results of this test indicate that the CXR test methodology can be used to characterize the direct drive component of what is generally referred to as Box IEMP response. Charge transfer effects on circuit lands and between circuit boards can be quantified by a CXR exposure as they have been in the CXR/PWM test reported in this paper (the PWM word strap configuration is similar in all respects to common circuit land layouts and board/board separations). There are other effects which are explicitly time dependent that can occur within electronics enclosures, commonly referred to as E-dot and B-dot coupling.