DocumentCode :
8719
Title :
Control Plug Lateral Coupling Memory Cell Utilizing Uniform Channel Fowler–Nordheim Operation
Author :
Sung-Kun Park ; Kwang-Il Choi ; Eun-Mee Kwon ; In-Wook Cho ; Kyung-Dong Yoo
Author_Institution :
SK hynix, Cheongju, South Korea
Volume :
36
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
241
Lastpage :
243
Abstract :
In this letter, we propose a control-plug (CP) structure logic nonvolatile memory (LNVM) fabricated by a standard logic CMOS process for mobile applications with low-power-consumption requirement. The operating concept of this cell is based on the use of a lateral capacitance coupling between a bar-type CP and a floating gate. Owing to the unique bar-type CP-coupling method and CP-sharing cell array structure, the novel cell has a coupling ratio of over 94% with the lowest fill factor of 344 as a Fowler-Nordheim (FN)-operated LNVM. Furthermore, because of the high coupling ratio and divided-bias operating method, this cell utilizes a uniform-channel FN tunneling program and erase method using a 3.3 V logic peripheral overdrive tolerable voltage of 5.5 V.
Keywords :
CMOS logic circuits; low-power electronics; random-access storage; CP-sharing cell array structure; LNVM; bar-type CP-coupling method; control plug lateral coupling memory cell; coupling ratio; divided-bias operating method; erase method; fill factor; lateral capacitance coupling; logic nonvolatile memory; low-power-consumption requirement; mobile applications; standard logic CMOS process; uniform channel Fowler-Nordheim operation; uniform-channel FN tunneling program; voltage 3.3 V; voltage 5.5 V; Arrays; Channel hot electron injection; Couplings; Logic gates; Microprocessors; Nonvolatile memory; Embedded flash; embedded Flash; lateral coupling; nonvolatile memory (NVM); select gate (SG); standard logic CMOS;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2015.2389897
Filename :
7004780
Link To Document :
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