Title :
Heavy-Ion Induced Single Event Upsets in a Bipolar Logic Device
Author :
Kolasinski, W.A. ; Koga, R. ; Chenette, D.L.
Author_Institution :
Space Sciences Laboratory the Aerospace Corporation P. O. Box 92957 Los Angeles, CA 90009
Abstract :
We present heavy ion test results for a bipolar logic device of moderate complexity. Such devices require the implementation of special techniques for testing circuits of varying upset sensitivity, and unlike similar MOS devices, present problems with test data interpretation.
Keywords :
Aerospace testing; Circuit analysis; Circuit testing; Clocks; Latches; Logic devices; Master-slave; Microprocessors; Semiconductor device measurement; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333156
