Title :
Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data
Author :
Nichols, Donald K. ; Price, William E. ; Malone, Carl J.
Author_Institution :
Jet Propulsion Laboratory California Institute of Technology Pasadena, California
Abstract :
A summary of the data on single event upset (bit flips) for sixt-y device types, having data storage elements, that were tested by JPL through May, 1982, is presented. The data were taken from fifteen accelerator tests with both protons and heavier ions.
Keywords :
Aerospace testing; Cyclotrons; Ion accelerators; Laboratories; Life estimation; Memory; Protons; Semiconductor device testing; Semiconductor devices; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333164
