DocumentCode :
872102
Title :
Relationship between the slowing and loss in optical delay lines
Author :
Dubovitsky, Serge ; Steier, William H.
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Volume :
42
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
372
Lastpage :
377
Abstract :
In this paper, we demonstrate the relation between the amount of slowing and the amount of insertion loss in an optical slow wave structure when the material used has finite absorption. The delay properties are calculated as a function of wavelength for a single Fabry-Perot resonator and a delay line consisting of multiple coupled resonators. In all of these delay lines, if the amount of delay increases, the insertion loss of the line likewise increases. For low material loss, the normalized increase in delay is equal to the normalized increase in insertion loss. We also compare a coupled resonator delay line to a simple waveguide made of the same material and with the same amount of delay. The simple waveguide always has less insertion loss than the coupled resonator line because of the unavoidable reflection from the coupled resonator line. Even in the case of an asymmetric mirror delay line with zero reflection at the input, the simple waveguide has less insertion loss.
Keywords :
integrated optics; light reflection; mirrors; optical delay lines; optical losses; optical resonators; optical waveguide theory; asymmetric mirror delay line; coupled resonator delay line; finite absorption; insertion loss; material loss; multiple coupled resonators; optical delay lines; optical reflection; optical slow wave structure; optical slowing; optical waveguide; single Fabry-Perot resonator; zero reflection; Absorption; Delay lines; Fabry-Perot; Insertion loss; Optical losses; Optical materials; Optical reflection; Optical resonators; Optical waveguides; Propagation delay; Fabry–Perot (FP) resonator; optical delay line;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2006.871551
Filename :
1608205
Link To Document :
بازگشت