Title :
Aurora Test Cell Electron Beam Environment - Response of Large Loop
Author :
Bushell, M. ; Manriquez, R. ; Merkel, G. ; Scharf, W.D.
Author_Institution :
US Army Electronics Research and Development Command Harry Diamond Laboratories Adelphi, MD 20783
Keywords :
Circuit testing; Conductivity; Diodes; Electromagnetic measurements; Electron beams; Electronic equipment testing; Equations; Finite difference methods; Shape measurement; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4333170
