DocumentCode
872115
Title
Aurora Test Cell Electron Beam Environment - Response of Large Loop
Author
Bushell, M. ; Manriquez, R. ; Merkel, G. ; Scharf, W.D.
Author_Institution
US Army Electronics Research and Development Command Harry Diamond Laboratories Adelphi, MD 20783
Volume
30
Issue
6
fYear
1983
Firstpage
4558
Lastpage
4563
Keywords
Circuit testing; Conductivity; Diodes; Electromagnetic measurements; Electron beams; Electronic equipment testing; Equations; Finite difference methods; Shape measurement; Voltage;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4333170
Filename
4333170
Link To Document