Title :
Proximity Effects in the Near-Field EMF Metrology
Author :
Dlugosz, Tomasz ; Trzaska, Hubert
Author_Institution :
Tech. Univ. of Wroclaw, Wroclaw
fDate :
3/1/2009 12:00:00 AM
Abstract :
This paper discusses the errors caused by multiple mirror reflections of an object calibrated (antenna) or exposed (animal and device) in a transverse electromagnetic cell. Although the effect may entirely be evident in the results of experiments performed with the use of the cell or similar devices, it has never been taken into account. Its role is of primary importance in biomedical investigations and may cause the experiments to be of qualitative, rather than quantitative, character.
Keywords :
TEM cells; electromagnetic fields; measurement; reflector antennas; biomedical investigations; multiple mirror reflections; near-field EMF metrology; object calibration; proximity effects; transverse electromagnetic cell; Bioeffects; electromagnetic field (EMF) measurements; exposure system; near field; standard EMF;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2008.2005276