DocumentCode :
872276
Title :
Proximity Effects in the Near-Field EMF Metrology
Author :
Dlugosz, Tomasz ; Trzaska, Hubert
Author_Institution :
Tech. Univ. of Wroclaw, Wroclaw
Volume :
58
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
626
Lastpage :
630
Abstract :
This paper discusses the errors caused by multiple mirror reflections of an object calibrated (antenna) or exposed (animal and device) in a transverse electromagnetic cell. Although the effect may entirely be evident in the results of experiments performed with the use of the cell or similar devices, it has never been taken into account. Its role is of primary importance in biomedical investigations and may cause the experiments to be of qualitative, rather than quantitative, character.
Keywords :
TEM cells; electromagnetic fields; measurement; reflector antennas; biomedical investigations; multiple mirror reflections; near-field EMF metrology; object calibration; proximity effects; transverse electromagnetic cell; Bioeffects; electromagnetic field (EMF) measurements; exposure system; near field; standard EMF;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.2005276
Filename :
4631498
Link To Document :
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