DocumentCode :
872339
Title :
Reciprocity in silicon Schottky-barrier diodes
Author :
Anand, Y. ; Doherty, W.E.
Author_Institution :
Microwave Associates, Inc., Burlington, USA
Volume :
3
Issue :
6
fYear :
1967
fDate :
6/1/1967 12:00:00 AM
Firstpage :
236
Lastpage :
237
Abstract :
Reciprocity has been examined at X band for low-noise silicon Schottky-barrier diodes by measuring the forward (r.f. to i.f.) and reverse (i.f. to r.f.) conversion losses by the heterodyne method. Reciprocity held for the silicon Schottky-barrier diodes, proving that their low conversion-loss behaviour is due to the nonlinear barrier resistance and not to parametric amplification caused by a nonlinear barrier capacitance. For comparison, silicon epitaxial point-contact and germanium point-contact diodes were also examined.
Keywords :
semiconductor diodes;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19670180
Filename :
4207235
Link To Document :
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