Title :
Reciprocity in silicon Schottky-barrier diodes
Author :
Anand, Y. ; Doherty, W.E.
Author_Institution :
Microwave Associates, Inc., Burlington, USA
fDate :
6/1/1967 12:00:00 AM
Abstract :
Reciprocity has been examined at X band for low-noise silicon Schottky-barrier diodes by measuring the forward (r.f. to i.f.) and reverse (i.f. to r.f.) conversion losses by the heterodyne method. Reciprocity held for the silicon Schottky-barrier diodes, proving that their low conversion-loss behaviour is due to the nonlinear barrier resistance and not to parametric amplification caused by a nonlinear barrier capacitance. For comparison, silicon epitaxial point-contact and germanium point-contact diodes were also examined.
Keywords :
semiconductor diodes;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19670180