• DocumentCode
    872633
  • Title

    SAW resonator design and fabrication for 2.0, 2.6 and 3.3 GHz

  • Author

    Pendergrass, Larry L. ; Studebaker, Lawrence G.

  • Author_Institution
    Hewlett-Packard Co., Santa Rosa, CA, USA
  • Volume
    35
  • Issue
    3
  • fYear
    1988
  • fDate
    5/1/1988 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    379
  • Abstract
    Direct-write electron-beam lithography has been used to fabricate surface-acoustic-wave (SAW) resonators in quartz at 2.05, 2.60, and 3.30 GHz. Typical 2.05-GHz devices show unloaded Q factors of about 2700 and insertion losses of about 9 dB. The best 2.60-GHz devices have unloaded Q of about 2000 with insertion losses less than 11 dB. Preliminary 3.3-GHz devices have shown unloaded Q of about 1600 and insertion losses of 17 dB. These results are for devices tested in chip form in a 50- Omega system. The fabrication of a fundamental-mode resonator with center frequency exceeding 2.6 GHz is claimed to be unmatched in the literature. These results are due in part to improvements in design and electron-beam direct-write capabilities. Design and fabrication of SAW resonators above 2 GHz are described, test results for several wafers including preliminary phase noise measurements for devices at 2 GHz are reported, and problems associated with testing these devices are discussed.<>
  • Keywords
    microwave oscillators; surface acoustic wave devices; 2.05 GHz; 2.6 GHz; 3.3 GHz; Q factors; SAW resonator; design; electron-beam lithography; fabrication; fundamental-mode; insertion losses; microwave; phase noise measurements; Fabrication; Insertion loss; Lithography; Noise measurement; Phase measurement; Phase noise; Resonant frequency; Surface acoustic waves; System testing;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.20457
  • Filename
    20457