DocumentCode
872633
Title
SAW resonator design and fabrication for 2.0, 2.6 and 3.3 GHz
Author
Pendergrass, Larry L. ; Studebaker, Lawrence G.
Author_Institution
Hewlett-Packard Co., Santa Rosa, CA, USA
Volume
35
Issue
3
fYear
1988
fDate
5/1/1988 12:00:00 AM
Firstpage
372
Lastpage
379
Abstract
Direct-write electron-beam lithography has been used to fabricate surface-acoustic-wave (SAW) resonators in quartz at 2.05, 2.60, and 3.30 GHz. Typical 2.05-GHz devices show unloaded Q factors of about 2700 and insertion losses of about 9 dB. The best 2.60-GHz devices have unloaded Q of about 2000 with insertion losses less than 11 dB. Preliminary 3.3-GHz devices have shown unloaded Q of about 1600 and insertion losses of 17 dB. These results are for devices tested in chip form in a 50- Omega system. The fabrication of a fundamental-mode resonator with center frequency exceeding 2.6 GHz is claimed to be unmatched in the literature. These results are due in part to improvements in design and electron-beam direct-write capabilities. Design and fabrication of SAW resonators above 2 GHz are described, test results for several wafers including preliminary phase noise measurements for devices at 2 GHz are reported, and problems associated with testing these devices are discussed.<>
Keywords
microwave oscillators; surface acoustic wave devices; 2.05 GHz; 2.6 GHz; 3.3 GHz; Q factors; SAW resonator; design; electron-beam lithography; fabrication; fundamental-mode; insertion losses; microwave; phase noise measurements; Fabrication; Insertion loss; Lithography; Noise measurement; Phase measurement; Phase noise; Resonant frequency; Surface acoustic waves; System testing;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.20457
Filename
20457
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