• DocumentCode
    872709
  • Title

    Compact modeling and fast simulation of on-chip interconnect lines

  • Author

    Ioan, Daniel ; Ciuprina, Gabriela ; Radulescu, Marius ; Seebacher, Ehrenfried

  • Author_Institution
    Electr. Eng. Dept., Bucharest Univ.
  • Volume
    42
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    547
  • Lastpage
    550
  • Abstract
    An efficient methodology to extract compact models for microstrip lines on lossy silicon substrate is presented. The transversal magnetic field equations are solved by dual finite integration technique (dFIT), a numerical method which allows the accuracy control of the computed frequency dependent line parameters. Several techniques are used to accelerate the process of p.u.l. parameters extraction, such as minimal virtual boundary, minimal mesh and minimal frequency samples set. The solution of the transmission line equations with frequency dependent parameters is then approximated by a rational function of appropriate degree in order to extract the compact model and its SPICE equivalent circuit. The behavior of the obtained compact model of order 10 shows good agreement with respect to the measured data
  • Keywords
    SPICE; circuit simulation; equivalent circuits; magnetic field integral equations; microstrip lines; network synthesis; silicon; system-on-chip; transmission line theory; SPICE; accuracy control; compact modeling; dual finite integration technique; equivalent circuit; fast simulation; frequency dependent line parameters; microstrip lines; on-chip interconnect line; rational function; transmission line equations; transversal magnetic field equations; Acceleration; Computational modeling; Distributed parameter circuits; Equations; Frequency dependence; Integrated circuit interconnections; Magnetic fields; Microstrip; Parameter extraction; Silicon; Distributed parameter circuits; electromagnetic analysis; finite integration technique (FIT); integrated circuit design; interconnects; model extraction; model order reduction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.871466
  • Filename
    1608264