DocumentCode
872709
Title
Compact modeling and fast simulation of on-chip interconnect lines
Author
Ioan, Daniel ; Ciuprina, Gabriela ; Radulescu, Marius ; Seebacher, Ehrenfried
Author_Institution
Electr. Eng. Dept., Bucharest Univ.
Volume
42
Issue
4
fYear
2006
fDate
4/1/2006 12:00:00 AM
Firstpage
547
Lastpage
550
Abstract
An efficient methodology to extract compact models for microstrip lines on lossy silicon substrate is presented. The transversal magnetic field equations are solved by dual finite integration technique (dFIT), a numerical method which allows the accuracy control of the computed frequency dependent line parameters. Several techniques are used to accelerate the process of p.u.l. parameters extraction, such as minimal virtual boundary, minimal mesh and minimal frequency samples set. The solution of the transmission line equations with frequency dependent parameters is then approximated by a rational function of appropriate degree in order to extract the compact model and its SPICE equivalent circuit. The behavior of the obtained compact model of order 10 shows good agreement with respect to the measured data
Keywords
SPICE; circuit simulation; equivalent circuits; magnetic field integral equations; microstrip lines; network synthesis; silicon; system-on-chip; transmission line theory; SPICE; accuracy control; compact modeling; dual finite integration technique; equivalent circuit; fast simulation; frequency dependent line parameters; microstrip lines; on-chip interconnect line; rational function; transmission line equations; transversal magnetic field equations; Acceleration; Computational modeling; Distributed parameter circuits; Equations; Frequency dependence; Integrated circuit interconnections; Magnetic fields; Microstrip; Parameter extraction; Silicon; Distributed parameter circuits; electromagnetic analysis; finite integration technique (FIT); integrated circuit design; interconnects; model extraction; model order reduction;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2006.871466
Filename
1608264
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