• DocumentCode
    873020
  • Title

    Noise-parameter measurements of microwave transistors up to 2.4 GHz

  • Author

    B¿¿chtold, W. ; Strutt, M.J.O.

  • Author_Institution
    Swiss Federal Institute of Technology, Department of Advanced Electrical Engineering, Zurich, Switzerland
  • Volume
    3
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    323
  • Lastpage
    324
  • Abstract
    Noise and gain measurements of microwave transistors in the frequency region 0.6¿2.4 GHz have been carried out. The results, the optimum noise figure and the optimum source admittance as a function of frequency, as well as the optimum gain, noise figure and noise measure as a function of source admittance and collector current are discussed.
  • Keywords
    gain measurement; noise measurement; transistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19670247
  • Filename
    4207300
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=873020