• DocumentCode
    873058
  • Title

    Hp Ge: Purification, Crystal Growth, and Annealing Properties

  • Author

    Hall, R.N.

  • Author_Institution
    Corporate Research and Development General Electric Company Schenectady, NY 12301
  • Volume
    31
  • Issue
    1
  • fYear
    1984
  • Firstpage
    320
  • Lastpage
    325
  • Abstract
    The prospects for growing HP Ge crystals of increased size and purity are examined. One interesting approach is to grow dislocation-free crystals, which must then be annealed to reduce the concentration of V2H traps. The phenomena which occur during annealing are discussed and compared with experiment. Hydrogen, present in atomic form at the growth temperature, forms H2 molecules during cooling, causing the effective diffusion coefficient to decrease rapidly. Models representing the reactions between H and the V2H, A(H, Si), and D(H, O) complexes are presented and analyzed.
  • Keywords
    Annealing; Crystalline materials; Crystals; Detectors; Furnaces; Germanium; Hydrogen; Impurities; Purification; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333268
  • Filename
    4333268