DocumentCode
873058
Title
Hp Ge: Purification, Crystal Growth, and Annealing Properties
Author
Hall, R.N.
Author_Institution
Corporate Research and Development General Electric Company Schenectady, NY 12301
Volume
31
Issue
1
fYear
1984
Firstpage
320
Lastpage
325
Abstract
The prospects for growing HP Ge crystals of increased size and purity are examined. One interesting approach is to grow dislocation-free crystals, which must then be annealed to reduce the concentration of V2H traps. The phenomena which occur during annealing are discussed and compared with experiment. Hydrogen, present in atomic form at the growth temperature, forms H2 molecules during cooling, causing the effective diffusion coefficient to decrease rapidly. Models representing the reactions between H and the V2H, A(H, Si), and D(H, O) complexes are presented and analyzed.
Keywords
Annealing; Crystalline materials; Crystals; Detectors; Furnaces; Germanium; Hydrogen; Impurities; Purification; Thermal stresses;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1984.4333268
Filename
4333268
Link To Document