Title :
A flexible approach to emitter-coupled logic arrays
Author :
D´Agostino, M.V. ; Feller, A.
Abstract :
The ECCSL arrays have been successfully fabricated using two levels of metalization on 120 by 120-mil chips. The yield, fabrication, and performance studies of these arrays, while not yet complete, indicate that current mode logic arrays of 10 to 30 gates are entirely feasible. This is especially true if the size of the chips are reduced as much as possible (preferably below 0.10 by 0.10 inch.) Indications are that arrays with relatively low gate counts (10 to 30 gates) greatly reduce the testing problems usually associated with array technology.
Keywords :
Current-mode logic; Digital integrated circuits; Integrated circuit production; Integrated circuit testing; Logic circuits; Monolithic integrated circuits; current-mode logic; digital integrated circuits; integrated circuit production; integrated circuit testing; logic circuits; monolithic integrated circuits; Data processing; Electronic components; Fabrication; Integrated circuit manufacture; Logic arrays; Logic devices; Logic functions; Pins; Registers; Resistors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1969.1049947
