Title :
Low-light-level properties of the phototransistor charge-storage mode
fDate :
6/1/1969 12:00:00 AM
Abstract :
The phototransistor charge-storage or integration mode at low light levels is described accurately using a simple model. The base-emitter junction governs charge readout at low levels, causing very nonlinear circuit behavior. Sluggish transient response, increased sensitivity of output to transistor current gain, and a nonlinear transfer characteristic degrade phototransistor low-light-level behavior more severely than junction dark current.
Keywords :
Phototransistors; Space charge; phototransistors; space charge; Bandwidth; Dark current; Degradation; Image storage; Leakage current; Linearity; Magnetic separation; Phototransistors; Solid state circuits; Transient response;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1969.1049976