• DocumentCode
    873559
  • Title

    Effects of local variations in skull and scalp thickness on EEG´s and MEG´s

  • Author

    Cuffin, B.Neil

  • Author_Institution
    Frances Bitter Nat. Magnet Lab., MIT, Cambridge, MA, USA
  • Volume
    40
  • Issue
    1
  • fYear
    1993
  • Firstpage
    42
  • Lastpage
    48
  • Abstract
    The results of a computer modeling study are reported. They indicate that local variations in skull and scalp thickness have effects on electroencephalograms (EEGs) and magnetoencephalograms (MEGs) which range from a simple intuitive effect to complex effects which depend on such factors as source depth and orientation, the geometry of the variation in skull and scalp thickness, etc. These results also indicate that local variations in skull and scalp thickness cause EEG localization errors which are generally much less than 1 cm and MEG localization errors which are even smaller. These results also indicate that multichannel and single-channel MEG measurements will produce localization errors of approximately the same amplitude when there is a bump on the external surface of the head but that multichannel measurements will produce significantly smaller localization errors than single-channel measurements when a depression is present in that surface.
  • Keywords
    biomagnetism; brain models; digital simulation; electroencephalography; MEG; electroencephalogram; head bump; local thickness variation effects; localization errors; magnetoencephalogram; multichannel measurements; scalp thickness; single-channel measurements; skull; source depth; surface depression; Brain modeling; Conductivity; Electric variables measurement; Electroencephalography; Geometry; Magnetic heads; Performance evaluation; Scalp; Skull; Thickness measurement; Action Potentials; Bias (Epidemiology); Brain; Cephalometry; Computer Simulation; Electric Conductivity; Electroencephalography; Electromagnetic Fields; Evaluation Studies as Topic; Humans; Magnetoencephalography; Models, Anatomic; Scalp; Skinfold Thickness; Skull;
  • fLanguage
    English
  • Journal_Title
    Biomedical Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9294
  • Type

    jour

  • DOI
    10.1109/10.204770
  • Filename
    204770