• DocumentCode
    873609
  • Title

    Low-Cost and Highly Heat Controllable Capacitorless PiFET (Partially Insulated FET) 1T DRAM for Embedded Memory

  • Author

    Bae, Dong-Il ; Kim, Sungho ; Choi, Yang-Kyu

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejeon
  • Volume
    8
  • Issue
    1
  • fYear
    2009
  • Firstpage
    100
  • Lastpage
    105
  • Abstract
    A body-tied partial-insulated FET (PiFET) one-transistor (1T) DRAM having good heat immunity for embedded memory is proposed in this paper. PiFET structure using partially insulated oxide (PiOX) formed on bulk wafer can act as a 1T DRAM by applying a negative back bias. The memory shows a good ldquo0rdquo-state retention characteristic due to reduced electric field and heat dissipation path. The body-tied PiFET provides a wider design window and flexibility to control retention characteristics than does silicon on insulator (SOI) FET. To evaluate the improvement of retention characteristics, we suggest a new retention degradation mechanism of 1T DRAM. In this paper, we suggest the possibility of 1T DRAM´s fabrication having good heat immunity.
  • Keywords
    DRAM chips; field effect transistors; DRAM; capacitorless PiFET; embedded memory; heat dissipation path; heat immunity; negative back bias; partially insulated FET; Capacitorless embedded memory; one-transistor (1T) DRAM; partial-insulated FET (PiFET); retention; sensing margin;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.2006502
  • Filename
    4633654