DocumentCode
873624
Title
Audiofrequency noise in silicon
Author
Leuenberger, F.
Author_Institution
Centre Electronique Horloger SA, Neuchâtel, Switzerland
Volume
3
Issue
9
fYear
1967
fDate
9/1/1967 12:00:00 AM
Firstpage
400
Abstract
Experimental results showing the effects of thermal oxidation and low-temperature annealing in nitrogen on noise-power spectra of single-crystal silicon samples are presented.
Keywords
crystal properties; noise; noise measurement; semiconductors;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19670310
Filename
4207359
Link To Document