Title :
Electromagnetic wave scattering from very rough surfaces composed of correlated large and small scale roughness
Author :
Kaufman, D.E. ; Hayre, H.S.
Keywords :
Capacitance; Electromagnetic scattering; Error analysis; FETs; Physics; Rough surfaces; Space charge; Surface roughness; Surface waves; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1965.4141
