DocumentCode :
873756
Title :
Notes on multiple input signature analysis
Author :
Kameda, Tiko ; Pilarski, Slawomir ; Ivanov, Andre
Author_Institution :
Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Volume :
42
Issue :
2
fYear :
1993
fDate :
2/1/1993 12:00:00 AM
Firstpage :
228
Lastpage :
234
Abstract :
Many results regarding the probability of aliasing for multiple-input compactors have been derived under error assumptions that are not very realistic for VLSI circuits. Recently, the value of aliasing probability has been proven to tend to 2-k, where k is the number of binary memory elements of the linear compactor. This result is based on the assumption that the compactor is characterized by an irreducible polynomial and that the `no error´ vector has a probability different from zero. In these notes, the above result is generalized. More specifically, it is proved that it is valid if any two error vectors, neither of which needs to be the `no error´ vector, have probabilities of occurrence different from zero. To make the error model complete, the situation in which exactly one error vector has a probability different from zero is also considered. For the latter type of error distributions, the test lengths at which aliasing occurs are determined. Simple proofs for the results are provided; they are based on standard linear algebra notions and well-known theorems
Keywords :
built-in self test; feedback; logic testing; shift registers; VLSI circuits; aliasing; binary memory elements; error assumptions; error model; irreducible polynomial; multiple input signature analysis; multiple-input compactors; probability; standard linear algebra notions; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Electrical fault detection; Fault detection; Test pattern generators; Vectors;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.204795
Filename :
204795
Link To Document :
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