Title :
Frequency-modulation noise in Gunn oscillators
Author :
Faulkner, E.A. ; Meade, M.L.
Author_Institution :
University of Reading, J.J. Thomson Physical Laboratory, Reading, UK
fDate :
9/1/1967 12:00:00 AM
Abstract :
The frequency-modulation noise in X band Gunn oscillators has been measured. The overall spectral width is determined by low-rate (<1Hz) fluctuations with an r.m.s. value in the region of 3kHz.
Keywords :
Gunn effect; fluctuations; oscillators; semiconductor devices; semiconductors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19670326
