DocumentCode :
873830
Title :
Remote Measurement of Temperature in the Presence of a Strong Magnetic Field
Author :
Lord, Scott Frederick ; Firebaugh, Samara L. ; Smith, Andrew N.
Author_Institution :
U.S. Naval Acad., Annapolis, MD
Volume :
58
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
674
Lastpage :
680
Abstract :
This paper describes the development of a temperature sensor suitable for use in a pulse power system. Such systems generate large time-varying magnetic fields, which complicate instrumentation. A temperature-sensing system has been developed that can remotely capture information necessary to determine the temperature of a surface in the presence of a strong electromagnetic field. This sensor is based on an interferometer using a thin sapphire die coated with nickel and nickel oxide as the sensing element. A model was developed to predict the behavior of the sensor to determine the ideal layer thickness. With this system, temperature measurement has been demonstrated in the presence of a large time-varying magnetic field at a sampling rate of 1000 Hz over a range of 20degC to 350degC.
Keywords :
electromagnetic fields; light interferometry; magnetic field effects; nickel; nickel compounds; optical sensors; pulsed power technology; sapphire; temperature measurement; temperature sensors; thickness measurement; thin film sensors; Al2O3; Ni; NiO; frequency 1000 Hz; layer thickness determination; light interferometer; pulse power system; temperature 20 degC to 350 degC; temperature measurement; temperature sensor; thin sapphire die; time-varying magnetic fields; Interferometry; nickel; pulse power systems; sapphire; temperature measurement; thin films;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2008.2005074
Filename :
4633678
Link To Document :
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