DocumentCode :
873898
Title :
Sample-tip interaction of piezoresponse force microscopy in ferroelectric nanostructures
Author :
Peter, Frank ; Rüdiger, Andreas ; Szot, Krzysztof ; Waser, Rainer ; Reichenberg, Bernd
Author_Institution :
Inst. fur Festkorperforschung, Forschungszentrum Julich
Volume :
53
Issue :
12
fYear :
2006
fDate :
12/1/2006 12:00:00 AM
Firstpage :
2253
Lastpage :
2260
Abstract :
We report on qualitative and quantitative implications of the sample-tip interaction in piezoresponse force microscopy. Our finite-element analysis of adsorbate effects, sample heterogeneities, and tip asymmetries is in agreement with experimental observation of ferroelectric nanostructures. Qualitative discrepancies arise from locally asymmetric tip-sample interaction. Any quantitative determination of field-related material parameters as required for the verification of semiempirical models of the ferroelectric limit typically relies on an overestimated field across the sample. Our findings indicate that adsorbates reduce the actual field across the nanograin by roughly one order of magnitude
Keywords :
adsorbed layers; atomic force microscopy; ferroelectric materials; finite element analysis; nanostructured materials; piezoelectricity; adsorbate effects; ferroelectric limit; ferroelectric nanostructures; field-related material parameters; finite-element analysis; nanograin; piezoresponse force microscopy; Atomic force microscopy; Ferroelectric materials; Finite element methods; Force measurement; Nanostructures; Optical noise; Optical variables control; Photodiodes; Ultrasonic variables measurement; Voltage;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2006.170
Filename :
4037258
Link To Document :
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