Title :
Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers
Author :
Dawber, Matthew ; Lichtensteiger, Celine ; Paruch, Patrycja ; Triscone, Jean-Marc
Author_Institution :
DPMC, Geneva Univ.
fDate :
12/1/2006 12:00:00 AM
Abstract :
Understanding the behavior of ferroelectrics on the nanoscale level requires the production of materials of the highest quality and advanced characterization techniques for probing the fascinating properties of these systems with reduced dimensions. Here we give an overview of our recent achievements in this area, which includes the detailed study of the suppression of ferroelectricity in PbTiO3 thin films, the fabrication of PbTiO3/SrTiO3 superlattices in which ferroelectricity shows some surprising behavior, and finally the manipulation of nanoscale ferroelectric domains using the atomic force microscope which leads to the precise analysis of domain wall creep and roughness in Pb(Zr,Ti)O3 thin films
Keywords :
atomic force microscopy; electric domain walls; epitaxial growth; ferroelectric thin films; ferroelectricity; lead compounds; nanotechnology; oxygen compounds; strontium compounds; superlattices; titanium compounds; zirconium compounds; Pb(ZrTi)O3; PbTiO3; PbTiO3-SrTiO3; atomic force microscope; domain wall creep; domain wall roughness; epitaxial ferroelectric thin films; ferroelectricity; multilayers; nanoscale ferroelectric domains; superlattices; Atomic force microscopy; Atomic layer deposition; Fabrication; Ferroelectric materials; Magnetic flux; Magnetic superlattices; Metallic superlattices; Nonhomogeneous media; Sputtering; Transistors;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2006.171
