DocumentCode :
873926
Title :
Multimodal characterization of planar microwave structures
Author :
Soliman, Ezzeldin A. ; Vandenbosch, Guy A E ; Beyne, Eric ; Mertens, Robert P.
Author_Institution :
Microsystems, Components, & Packaging Div., Interuniv. Microelectron. Center, Leuven, Belgium
Volume :
52
Issue :
1
fYear :
2004
Firstpage :
175
Lastpage :
182
Abstract :
In this paper, a generalized deembedding technique is presented. It provides a multimodal characterization for microwave devices fed with planar guiding structures of arbitrary configurations. Instead of the conventional scattering matrix, the proposed technique leads to the multimodal scattering matrix. This matrix describes all possible kinds of mutual coupling between the different modes present on the feeding ports. In order to achieve this task, the feeding planar guiding structures are analyzed a priori using a full-wave two-dimensional solver. The generalizability of the proposed deembedding technique is demonstrated by characterizing a couple of coplanar-waveguide-based discontinuities. The results show that the proposed technique provides a rigorous and a detailed characterization.
Keywords :
S-matrix theory; coplanar waveguides; coupled mode analysis; matrix decomposition; method of moments; waveguide discontinuities; waveguide theory; CPW line; CPW-to-triple-slot-line transition; arbitrary configurations; coplanar-waveguide-based discontinuities; electromagnetic fields environment; feeding ports; full-wave two-dimensional solver; generalized deembedding technique; method of moments; multimodal characterization; multimodal scattering matrix; mutual coupling; planar guiding structures; planar microwave structures; right-angle bend; Coplanar waveguides; Electromagnetic scattering; Electromagnetic waveguides; Electronics packaging; Equations; Microelectronics; Microwave devices; Planar waveguides; Propagation constant; Transmission line matrix methods;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.821270
Filename :
1262690
Link To Document :
بازگشت