DocumentCode :
87410
Title :
Opportunities for shear energy scaling in bulk acoustic wave resonators
Author :
Jose, Sneha ; Hueting, Raymond J. E.
Author_Institution :
Quality & Reliability, NXP Semicond., Nijmegen, Netherlands
Volume :
61
Issue :
10
fYear :
2014
fDate :
Oct. 2014
Firstpage :
1720
Lastpage :
1728
Abstract :
An important energy loss contribution in bulk acoustic wave resonators is formed by so-called shear waves, which are transversal waves that propagate vertically through the devices with a horizontal motion. In this work, we report for the first time scaling of the shear-confined spots, i.e., spots containing a high concentration of shear wave displacement, controlled by the frame region width at the edge of the resonator. We also demonstrate a novel methodology to arrive at an optimum frame region width for spurious mode suppression and shear wave confinement. This methodology makes use of dispersion curves obtained from finite-element method (FEM) eigenfrequency simulations for arriving at an optimum frame region width. The frame region optimization is demonstrated for solidly mounted resonators employing several shear wave optimized reflector stacks. Finally, the FEM simulation results are compared with measurements for resonators with Ta2O5/ SiO2 stacks showing suppression of the spurious modes.
Keywords :
acoustic resonators; bulk acoustic wave devices; eigenvalues and eigenfunctions; elastic waves; finite element analysis; silicon compounds; tantalum compounds; FEM eigenfrequency simulations; Ta2O5-SiO2; Ta2O5-SiO2 stacks; bulk acoustic wave resonators; device horizontal motion; dispersion curves; energy loss contribution; finite element method; frame region width; resonator edge; shear confined spot scaling; shear energy scaling; shear wave confinement; shear wave displacement; shear waves; solidly mounted resonators; spurious mode suppression; vertically propagating transversal waves; Acoustics; Analytical models; Boundary conditions; Dispersion; Erbium; Finite element analysis; Resonant frequency;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2014.006447
Filename :
6910382
Link To Document :
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