Measuring the intrinsic-base-region currents of a transistor
Author :
Boothroyd, A.R.
Volume :
3
Issue :
10
fYear :
1967
fDate :
10/1/1967 12:00:00 AM
Firstpage :
456
Lastpage :
457
Abstract :
An experimental method of cancelling depletion-layer capacitance-current flow to permit exact observations of the current flow into the transistor `intrinsic base region¿ is described.
