DocumentCode :
874296
Title :
Photo-induced breakdown in p-n junctions
Author :
Josephs, H.C.
Volume :
53
Issue :
9
fYear :
1965
Firstpage :
1247
Lastpage :
1247
Keywords :
Acceleration; Avalanche breakdown; Breakdown voltage; Cathodes; Charge carrier processes; Electric breakdown; Electrons; Ionization; P-n junctions; Solids;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4194
Filename :
1446124
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=874296
