Title :
Impact of the radiation environment on integrated-circuit technology
Author :
Spratt, James P. ; Schnable, George L. ; Standeven, Joseph D.
Abstract :
Techniques used to design and produce silicon monolithic integrated circuits for use in the radiation environment found near a nuclear detonation are reviewed. The procedures used to define an anticipated threat are given, and interactions between typical radiations and IC materials are discussed. Circuit selection and design with respect to these interactions are considered process developments needed to implement these designs reviewed. The electrical and radiation performance currently available in production from several sources is described.
Keywords :
Monolithic integrated circuits; Radiation effects; monolithic integrated circuits; radiation effects; Electron devices; Foot; Impedance; Integrated circuit interconnections; Integrated circuit technology; Logic devices; Nuclear weapons; Production; Solid state circuits; Wiring;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1970.1050060
