Title :
Noise in integrated-circuit transistors
Author :
Brodersen, Arthur J. ; Chenette, Eugene R. ; Jaeger, Richard C.
fDate :
4/1/1970 12:00:00 AM
Abstract :
Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.
Keywords :
Bipolar transistors; Integrated circuits; Noise; bipolar transistors; integrated circuits; noise; Circuit noise; Electrical resistance measurement; Electron tubes; Integrated circuit measurements; Integrated circuit noise; Laboratories; Noise generators; Noise measurement; Pulse measurements; Transistors;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1970.1050072
