DocumentCode :
874591
Title :
Low-level microwave limiting utilizing impact ionization in bulk germanium at 4.2°K
Author :
Heinz, W.W. ; Okwit, S.
Author_Institution :
Airborne Instruments Lab., A Division of Cutler-Hammer, Melville, N.Y.
Volume :
53
Issue :
9
fYear :
1965
Firstpage :
1274
Lastpage :
1274
Keywords :
Bandwidth; Conductivity; Electric breakdown; Frequency; Garnets; Germanium; Impact ionization; Insertion loss; Microwave devices; Semiconductor impurities;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4223
Filename :
1446153
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=874591
