• DocumentCode
    874624
  • Title

    Sequential model criticism in probabilistic expert systems

  • Author

    Cowell, Robert G. ; Dawid, A. Philip ; Spiegelhalter, David J.

  • Author_Institution
    Dept. of Stat. Sci., Univ. Coll. London, UK
  • Volume
    15
  • Issue
    3
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    209
  • Lastpage
    219
  • Abstract
    Probabilistic expert systems based on Bayesian networks require initial specification of both qualitative graphical structure and quantitative conditional probability assessments. As (possibly incomplete) data accumulate on real cases, the parameters of the system may adapt, but it is also essential that the initial specifications be monitored with respect to their predictive performance. A range of monitors based on standardized scoring rules that are designed to detect both qualitative and quantitative departures from the specified model is presented. A simulation study demonstrates the efficacy of these monitors at uncovering such departures
  • Keywords
    Bayes methods; expert systems; probabilistic logic; Bayesian networks; probabilistic expert systems; qualitative graphical structure; quantitative conditional probability assessments; scoring rules; sequential model criticism; Bayesian methods; Computational modeling; Computer displays; Computer networks; Condition monitoring; Databases; Expert systems; Helium; Random variables; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.204903
  • Filename
    204903