Title :
Huber’s M-Estimation-Based Process Uncertainty Robust Filter for Integrated INS/GPS
Author :
Lubin Chang ; Kailong Li ; Baiqing Hu
Author_Institution :
Dept. of Navig. Eng., Naval Univ. of Eng., Wuhan, China
Abstract :
The integration of the inertial navigation system and the global positioning system (INS/GPS) is a widely used procedure for position and attitude determination applications. The Kalman type filter (KTF) is the primary mechanism to perform the integration. In the KTF, the process noise is always assumed to be Gaussian distribution, which may be violated by the vehicle´s severe maneuver, resulting in a much degraded performance. In this paper, the Huber´s M-estimation methodology is investigated to suppress the process uncertainty, founded on the cascaded form of the M-estimation-based Kalman filter. An iterated algorithm is designed to construct the weighted matrix to rescale the prior state estimate covariance. The proposed process uncertainty robust algorithm is embedded into the newly derived modified unscented quaternion estimator to perform the standard inertial navigation equations-based INS/GPS integration. The car-mounted experiments are carried out to validate the proposed method against the process uncertainty.
Keywords :
Gaussian distribution; Global Positioning System; Kalman filters; automobiles; inertial navigation; iterative methods; Gaussian distribution; Huber M-estimation-based process uncertainty robust filter; KTF; Kalman type filter; M-estimation-based Kalman filter; attitude determination applications; car-mounted experiments; global positioning system; inertial navigation system; iterated algorithm; position determination applications; process noise; process uncertainty; standard inertial navigation equations-based INS-GPS integration; state estimate covariance; vehicle severe maneuver; Global Positioning System; Kalman filters; Mathematical model; Quaternions; Robustness; Sensors; Uncertainty; Huber’s M-estimation; Huber???s M-estimation; INS/GPS; Kalman filter; integration; process uncertainty;
Journal_Title :
Sensors Journal, IEEE
DOI :
10.1109/JSEN.2014.2384492