Title :
PYFS-a statistical optimization method for integrated circuit yield enhancement
Author :
Pan, ShaoWei ; Hu, Yu Hen
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
An efficient optimization method for the statistical design of integrated circuits is presented. This method, called the pseudo yield function substitution (PYFS) algorithm, is developed to help a designer select design parameters to maximize the product yield. The design goal of PYFS is to use fewer simulation runs to reach a yield-optimized design. This is accomplished with the development of an improved response surface method for accurate estimation of the circuit response function, and the use of a novel PYFS method for yield maximization
Keywords :
circuit CAD; integrated circuit technology; optimisation; statistical analysis; PYFS algorithm; integrated circuit yield enhancement; pseudo yield function substitution; statistical design; statistical optimization method; yield maximization; Algorithm design and analysis; Circuit simulation; Circuit synthesis; Design methodology; Integrated circuit yield; Manufacturing; Optimization methods; Response surface methodology; Search methods; Yield estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
