Title :
Field Funneling and Range Straggling in Partially Depleted Silicon Surface-Barrier Detectors
Author :
Zoutendyk, J.A. ; Malone, C.J.
Abstract :
The effects of field funneling and range straggling have been quantitatively observed in the measurement of charge collected from alpha-particle tracks in silicon surface-barrier charged-particle detectors. The method described may be used for the straight-forward measurement of charge collection from heavy ions in these and other semiconductor devices.
Keywords :
Capacitance measurement; Charge measurement; Current measurement; Detectors; Electric variables measurement; Energy measurement; Plasma measurements; Schottky barriers; Silicon; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333463
