Title :
Single Event Upset Rate Predictions for Complex Logic Systems
Author :
Diehl-Nagle, S.E. ; Vinson, J.E. ; Peterson, E.L.
Author_Institution :
North Carolina State University Raleigh, NC 27695-7911
Keywords :
Combinational circuits; DRAM chips; Decoding; Latches; Logic arrays; Logic circuits; Logic devices; Random access memory; Read-write memory; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333470
