• DocumentCode
    875052
  • Title

    An HDL Simulation of the Effects of Single Event Upsets on Microprocessor Program Flow

  • Author

    Li, K.W. ; Armstrong, J.R. ; Tront, J.G.

  • Author_Institution
    Department of Electrical Engineering Virginia Tech Blacksburg, VA 24061
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1139
  • Lastpage
    1144
  • Abstract
    Simulation experiments for determining the effects of single event upsets on microprocessor program flow are described. A 16 bit microprocessor is modeled using a hardware description language. Using pseudorandom selection of event time and effected flip-flop, SEU´s are injected into the microprocessor model. Upset detectors are modeled along with the microprocessor for determination of fault coverage of several candidate fault detection techniques.
  • Keywords
    Application software; Computer errors; Detectors; Discrete event simulation; Fault detection; Hardware design languages; Instruments; Microprocessors; Single event transient; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333471
  • Filename
    4333471
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875052