Title :
An HDL Simulation of the Effects of Single Event Upsets on Microprocessor Program Flow
Author :
Li, K.W. ; Armstrong, J.R. ; Tront, J.G.
Author_Institution :
Department of Electrical Engineering Virginia Tech Blacksburg, VA 24061
Abstract :
Simulation experiments for determining the effects of single event upsets on microprocessor program flow are described. A 16 bit microprocessor is modeled using a hardware description language. Using pseudorandom selection of event time and effected flip-flop, SEU´s are injected into the microprocessor model. Upset detectors are modeled along with the microprocessor for determination of fault coverage of several candidate fault detection techniques.
Keywords :
Application software; Computer errors; Detectors; Discrete event simulation; Fault detection; Hardware design languages; Instruments; Microprocessors; Single event transient; Single event upset;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333471
