Title :
Charge Collection in Multilayer Structures
Author :
Knudson, A.R. ; Campbell, A.B. ; Shapiro, P. ; Stapor, W.J. ; Wolicki, E.A. ; Petersen, E.L. ; Diehl-Nagle, S.E. ; Hauser, J. ; Dressendorfer, P.V.
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375
Abstract :
Charge collection measurements using energetic ions have been performed on layered structures in bulk and epitaxial silicon. Both fast transient digitizer and slower charge sensitive preamplifier measurements have been made as a function of bias, ion type, energy, and angle of incidence. The existence of pulses of both polarities on a node after passage of a charged particle has been seen in certain Cases.
Keywords :
Charge measurement; Current measurement; Energy measurement; Integrated circuit measurements; Laboratories; Nonhomogeneous media; Pulse measurements; Single event transient; Time measurement; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1984.4333473
